The overall objective of the research chair is to develop a rigorous methodology for the design of highly integrated and highly reliable systems.

  • "Hybrid" refers to systems that can contain both electronic and non-electronic components (e.g.:  mechanical systems). Digital electronic systems will be targeted in the short term. In the medium term, analog electronic parts will be considered, and in the long term, non-electrical systems will complete the hybrid systems.
  • "Highly integrated" refers to advanced microelectronic/nanoelectronic-based complex systems, including sophisticated encapsulation techniques such as 3D encapsulation and system-in-package. Such systems are uniquely characterized by offering very few access points.
  • "Highly reliable" systems are systems that must meet very strict criteria in terms of responses provided. Such systems require some of the most stringent design and testing methodologies. Avionic systems constitute a good example of such systems.

Chair holder

Claude Thibeault, PhD is a professor at the Department of Electrical Engineering. His research areas include reliability and fault tolerance (particularly faults resulting from cosmic radiation) as well as the design, verification, testing and diagnosis of integrated circuits and embedded systems, based on FPGA programmable circuits technology. Claude Thibeault has been involved in the design and implementation of several such systems, including the Microgravity Vibration Isolation Subsystem, which has been installed on board the International Space Station. He is presently collaborating with CMC Microsystems in developing a methodology for designing embedded systems using 3D encapsulation technology. Moreover, he is the academic leader of the CRIAQ AVIO403 project examining the impact of cosmic radiation on embedded systems. Professor Thibeault holds 11 American patents, and has published more than 120 journal and conference proceedings articles, which have been cited more than 540 times. He received the Best Paper Award at DVCON’05, Verification category.

Professor Thibeault is actively involved in organizing international conferences. Since 1993, he has been a member of the IEEE Symposium on Defect and Fault Tolerance in VLSI Systems Program Committee, and was co-chair of the event in 1997. He has also been a member of the IEEE VLSI Test Symposium Program Committee since 2000, and, in 2012, is president of the same committee for a third year. Finally, it should be noted that he has served various roles in the organization of the IEEE NEWCAS conference ever since it was created in 2003.

Professor Thibeault is a senior member of the IEEE and of RESMIQ.